Paper on ML-Enabled Geometric Compliance Improvement for Two-Photon Lithography Published in JMP

Our paper titled “Machine-learning-enabled geometric compliance improvement in two-photon lithography without hardware modifications” has been published on Journal of Manufacturing Processes. The paper was co-authored by Yuhang Yang and Prof. Chenhui Shao. In recent years, two-photon lithography (TPL) has emerged as a practical and promising micro- and nano-fabrication technique for a wide range of applications. […]